Used JEOL JSM 810A #293592662 for sale

JEOL JSM 810A is a scanning electron microscope (SEM) suitable for a wide variety of applications in the life and physical sciences. This type of SEM has become an essential tool for sample analysis, imaging, and characterization in the fields of nanomaterials engineering, medical diagnostics and drug development, materials science and many other fields. Designed with superior performance and unprecedented accuracy, JSM 810A features an advanced ultra-high vacuum column, redrawn to minimize energy loss, and improved electron optics, resulting in high resolution imaging and particle analysis capabilities. JEOL JSM 810A offers a range of sample characterization techniques such as EDX (energy dispersive X-ray spectroscopy), EBSD (electron backscatter diffraction), WDD (wide-angle dark-field detector), and STEM (scanning/transmission electron microscopy), to name a few. These techniques provide valuable information about the elemental composition and structure of samples. The SEM also allows for evaluation of three-dimensional samples with high-definition 3D observation capabilities such as high-resolution SEM imaging and automatic stitching. The latter eliminates the tedious manual image stitching process and the potential error associated with it. Furthermore, JSM 810A is equipped with various imaging modes, allowing users to customize their experience to best meet the demands of their application. JEOL JSM 810A also allows users to acquire a variety of spectra such as EDX, EBSD, and Secondary/Tertiary Electron Emission (TEE). Spectra acquisition is enhanced with its high-speed, high-resolution detector and computer-controlled electronics. The TEE data can be used to offer sub-surface elemental mapping of the sample. JSM 810A comes with an intuitive user interface to simplify the process of data collection and analysis. Its ergonomic design makes it much easier for users to access and manipulate the instrument's functions as well as providing them with extensive on-screen documentation regarding imaging parameters, applications and data analysis. Overall, JEOL JSM 810A is an advanced SEM suitable for a huge range of applications. Its superior electron optics, multiple spectra collection capabilities, and advanced image processing algorithms make it an ideal choice for users needing to perform high resolution analysis of their samples.