Used JEOL JSM 820 #9200141 for sale

JEOL JSM 820 is a scanning electron microscope (SEM) designed for precision imaging at the nanoscale. This instrument's design is optimized for a variety of applications, including imaging of biological specimens and 3D topography imaging of a range of materials. It has excellent low voltage electron energy capabilities, allowing for images to be captured at very low voltages with high resolution. This helps minimize specimen damage when imaging delicate samples. JSM 820 also offers digital imaging capabilities, including an available camera that can produce 16-bit grayscale images for accurate visualization of sample surfaces. The microscope also boasts a minimum spot resolution down to 2nm and its spot scan mode allows for scanning of areas up to 250 x 250 μm. JEOL JSM 820 comes with an extensive range of in-lens detectors for the collection of multiple signals including secondary electrons (SE), back-scattered electrons (BSE), and X-ray. These electron detectors offer an extremely broad range in terms of sensitivity and maximal dynamic range. One of the most convenient attributes of JSM 820 is its large sample chamber - with a specimen height clearance up to 67 mm - making it easy to load large specimens into the microscope so they can be manipulated without having to remove them from the chamber. Furthermore, JEOL JSM 820 offers an equipped automated sample transfer system with automated sample loading abilities that help reduce the risk of sample contamination. With its powerful imaging capabilities and reliable performance, JSM 820 is an ideal SEM for a variety of applications. It is an especially reliable choice for those interested in imaging delicate specimens without causing damage, or imaging large areas with a minimum spot resolution of 2nm.