Used JEOL JSM 820 #9373249 for sale

JEOL JSM 820 is a scanning electron microscope (SEM) used to analyze the morphology, composition, and crystallography of materials. It operates at a voltage of 0.1 - 30 kV and a nominal probe current of up to 200 nA, providing both high resolution imaging, and elemental identification. The SEM utilizes a field emission gun (FEG) source, which is thermally stabilized to ensure a consistent imaging performance and maintain excellent resolution across multiple scans. It can also be used for microanalysis and can be equipped with an X-ray detector, EDX (energy dispersive x-ray analysis) system, and a variety of probes to characterize a range of materials. JSM 820 features a wide working distance range, from 4mm to 30, 40 or 60 mm, allowing for wider fields of view. The imaging chamber is equipped with a motorized traversing stage that allows the sample under investigation to be moved horizontally and vertically across the specimen window with the assistance of 12 μm stepping motors. The examiners can also utilize the power iterator feature, which allows for microscope settings to be adjusted during the scan for accurate imaging and results. The microscope offers several ways to cool the specimen, including liquid nitrogen, liquid helium, water jet cooling, and eutectic cooling, to prevent sample damage during imaging. JEOL JSM 820 features multiple automated features such as semi and fully automated image stitching, automated macro programming, and automated stitching and compositing. The picture settings and parameters can be easily adjusted using an automated picture parameter set-up and saved for future imaging sessions. Additionally, for users with specialized SEM requirements, the microscope's software supports multiple operating modes including information mode, low kV mode, and single particle analysis (SPA). JSM 820 is designed for both practical and research purposes, providing precise measurements and accurate images. With its durable construction and precise performance, it can provide results suitable for resource and energy-related research, and other scientific fields such as material science and engineering.