Used JEOL JSM 840 #175953 for sale

JEOL JSM 840 is a scanning electron microscope (SEM) designed for precision research and analysis applications. It has a field emission gun (FEG) that generates high beam currents and a wide range of voltage for the desired resolution and beam capacity. Its digital signal processor (DSP) and high speed scanning ensure fast and smooth active scanning. The ultra-high resolution tilt angle detector provides precise and rapid auto- tilting. JSM 840 offers a magnification range up to 300,000x and resolution down to 1.0 nanometer. Its EDS system enables fast and accurate elemental analysis. The flexible switching ability between different modes (including SE, BSE, CL, and SE/BSE channeling) increases sample versatility and enables more efficient operation. The flow- type chamber control maintains a high vacuum, while the closed-loop pressure control minimizes environmental interference to the sample. JEOL JSM 840 also features an intuitive user interface with graphical functions and a dedicated graphic chip card, which simplifies operation. It can store up to 256 sample images in its memory and can be controlled remotely for time-efficient usage. The computer- integrated design allows for simultaneous operation of JSM 840 with other systems, such as SEM/EDS and SEM/FIB. It also supports data export to third-party software. JEOL JSM 840 is a reliable and multipurpose sampling system that provides superior results for a variety of research applications. Its high-performance system ensures precise measurements with minimal user effort. The robust design and quality control provide maximum reliability and maintainability. With its combination of features and excellent performance, JSM 840 is a powerful scanning electron microscope.