Used JEOL JSM 840A #293802277 for sale

JEOL JSM 840A is an advanced scanning electron microscope (SEM) that is used for detailed analysis of the surface and structures of various specimens. The SEM scans the surface, producing high-resolution images using a combination of secondary electrons, scanning backscattered electrons, and a wide range of X-ray spectra. With a working distance of up to 25mm and a beam current that can range from 10 nA to 1 µA, this model is well suited for a wide range of studies. The 840A offers advanced imaging features such as variable spot scanning, high speed acquisition, real time image processing, and integrated deposition control. Electron optics is guided by a cold field emission gun that has excellent stability and accuracy. An energy dispersive spectroscopy (EDS) probe also allows users to obtain elemental information from the samples being studied. Aptly named "High Bright Source", the 840A utilizes a special EB bias lens which enables the electrons to travel faster, resulting in a much brighter image. Moreover, the maximum magnification of the optical lens is up to 600,000X, allowing researchers to study even the smallest details on the surfaces of their specimens. JEOL JSM-840A also features a low acceleration voltage, allowing for even finer resolution. This allows users to pick out individual ionic lattice spacings, and other fine details. Additionally, the system includes a digital interface that makes it possible to connect to printers, video units, LAN, USB, and a PC. This SEM is well-suited for a variety of applications, including metallurgical studies, failure analysis, biological and environmental research, semiconductor analysis, materials testing, and more. With its high resolution imaging capabilities, advanced electronics, and reliable performance, JSM 840A is an ideal choice for anyone in need of a sophisticated and powerful system for in-depth analysis.