Used JEOL JSM 840A #9039277 for sale

Name: JEOL JSM 840A
Brand: JEOL
SKU: 9039277
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Scanning Electron Microscopes

Manufacturer

JEOL

Model

JSM 840A

ID: 9039277

Scanning electron microscope (SEM) Includes: Morphological observation Full element analysis capability Observation of specimen to 10 nm or less Specification: Resolution: Secondary electron image: 4nm-10nm (WD = 8mm-39mm, Acc. Volt = 35kV) Backscattered electron image: 10mn (WD = 8mm, Acc. Volt = 35kV) Magnification: 10X-300,000X Image modes: Secondary electron image Backscattered electron image Electron channeling pattern Emission pattern image Specimen movement: X= 15mm, Y=25mm, Z=31mm, Tilt: 90 degree Rotation: 360 degree endless. Specimen holders: 12.5 mm dia. x 10 mmH, 32 mm dia. x 20 mmH, 50 mm dia. x 10 mmH Specimen exchange Airlock type, up to 32mm dia. specimen.

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JEOL JSM 840A is a sophisticated scanning electron microscope (SEM) manufactured by JEOL Ltd. Engineering Company, a global leader in electron microscopy. JEOL JSM-840A is a high-resolution low-vacuum field emission scanning electron microscope with a large chamber design, allowing samples up to 130 millimeters in diameter to be observed at different magnifications and field sizes without the need for sample exchange. JSM 840A features an environmental engineering chamber, a top-of-the-line 80 millimeter objective lens, and a 3-megapixel type backscattered electron detector to improve high resolution imaging. The optics and detector are designed with the highest level of precision, delivering images with the most accurate detail. Additionally, JSM-840A is specially designed to provide flexibility, with a wide range of operating parameters and software solutions. The equipment further offers energy and angle-resolved imaging capabilities for materials science imaging. With the installation of the in-column energy selector, JEOL JSM 840A has the ability to accurately detect x-rays, electrons, and Auger signals for spectroscopic analysis. This unique functionality is often used for elemental, morphologic, and chemical analysis of samples. JEOL JSM-840A is further equipped with state-of-the-art control capabilities, allowing the user to accurately determine operating conditions and return to a predetermined set of conditions with a few simple keystrokes. Additionally, the system's external control software allows users to easily control multiple instruments remotely. Finally, JSM 840A provides for excellent repeatability and stability of operation and image quality due to its advanced own cooling unit and hybrid drive machine. The special conductive ceramic vacuum chamber further minimizes tool interference, allowing for more reliable analytical and imaging performance. JSM-840A is an invaluable tool for the research and analysis of materials, and is just one of the many JEOL products that can meet the needs of scientific professionals.