Used JEOL JSM IC848A #9039276 for sale
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ID: 9039276
Scanning electron microscope (SEM) with EDS, 6"
Includes:
Full element analysis capability
Large chamber design, 150 mm samples
Load lock
Full scanning in X and Y axis
Observation of 10 nm or less
Thermo Noran EDS detector (mounted)
No software or other hardware
Accelerating voltage:
0.2 to 40 kV (linked with bias, lens currents, and coil currents)
Magnification:
10x (at 39mm working distance) to 300,000x
100x (fixed)
Speciment movment rage:
X-direction: 160mm
Y-direction: 160mm
Z-direction: 38mm
Tilt : 0 to 60 degree
Specimen exchange:
By airlock: Up to 204mm dia. specimen holders
By stage drawout: Available
Speciment holder:
12.5mm dia. x 10mm H specimens (height adjustable)
102mm dia. x 0.5mm H specimens
153mm dia. x 1mm H specimens
204mm dia x 1mm H specimens.
JEOL JSM IC848A is a high-performance scanning electron microscope (SEM) designed for a range of analytical and imaging applications. Specifically, this SEM provides unsurpassed resolution to investigate biological and physical samples and to produce accurate analysis of their microstructures. With a wide range of analytical capabilities, JEOL IC848A is capable of producing highly detailed and accurate imaging of various microscopic structures. This powerful and efficient SEM is fitted with a high-resolution Erwin Einzel lens and an advanced quad-pole magnetic electron column. This combination of technology provides a high level of precision in the analysis and imaging of samples. Furthermore, the scanning equipment used by this SEM incorporates a fine field design, which enables it to capture the finest details of a sample at low magnification. This feature makes JEOL IC848A a valuable tool for scanning and imaging applications. Moreover, this instrument features an electron optical column and a digital readout system that can detect any changes in the sample's structure at a resolution of 0.02 microns. Due to its high resolution and advanced detection unit, JEOL IC848A can accurately measure the microstructure of various materials including metals, ceramics, and composite materials. In terms of imaging capability, JEOL IC848A features an electron photo multiplier camera and an ultra-high sensitivity detector. Both of these features provide high-quality and precise imaging results for a wide range of sample types. Users can control the optical functions of the SEM and save time by operating multiple image capture systems in tandem. To enhance its performance, JEOL IC848A integrates the latest soft X-ray lithography technology that allows users to understand the microstructure of materials in a highly accurate manner. Additionally, this SEM operates with an integrated inspection machine that can detect surface-level details of a sample and perform elemental analysis of any given material. Overall, JSM IC848A is a powerful and advanced scanning electron microscope that offers a range of analytical and imaging capabilities. With its advanced features and high-resolution imaging, it is a valuable tool to accurately characterize and analyze the microstructures of a variety of materials.
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