Used JEOL JSM IT100 #9242147 for sale

JEOL JSM IT100 is a state-of-the-art scanning electron microscope (SEM) designed primarily for imaging, analysis, and specimen preparation for a wide range of materials. This advanced high-performance SEM offers excellent flexibility for precise materials characterization. JEOL JSM-IT 100 utilizes a low voltage field emission gun (FEG) electron source exhibiting highly stable performance that enables excellent resolution and ultra-low voltage operation. The automated sample stage and viewing devices create an efficient imaging and analysis workflow for easy access to the SEMs capability. The equipment maintains an exemplary reproducibility of imaging parameters, allowing for accurate, repeatable results across different specimens. JSM IT 100 is equipped with a large field of view, a high magnification of up to 220,000X, and low energy loss in-lens fields, allowing for highly detailed imaging. The system also has a low noise floor for accurate signal-to-noise analysis. Additionally, JEOL JSM IT 100 offers a novel imaging mode—screening electron diffraction (SED)—which allows for high resolution imaging in ultra-high vacuum conditions while maintaining excellent depth resolution. JSM IT100 is a versatile unit with a wide range of applications. It can be used for surface analysis and imaging of materials, metals, structures, nanomaterials and devices, 3D imaging, failure analysis, and more. It can also be used for material characterization, such as measurements of grain size, distribution analysis, phase identification, and defect analysis. With its SD-BP automatic stage, users can prepare large area samples very quickly with a high degree of accuracy. The analytical capabilities of JSM-IT 100 can also be combined with a broad range of environmental equipments and imaging systems, such as energy-dispersive X-ray spectroscopy (EDS), X-ray fluorescent microscopy (XFM), and laser optical systems, for versatile research and workflows. Overall, JEOL JSM IT100 is a highly advanced scanning electron microscope designed for materials characterization and specimen preparation. It is easy-to-use and offers users excellent resolution, stability, and accuracy, as well as a wide range of analytical capabilities. This machine is perfect for the study of a broad range of nanomaterials and devices.