Used JEOL JSM IT100 #9394759 for sale
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ID: 9394759
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JEOL JSM IT100 is a scanning electron microscope produced by JEOL, a Japanese company that specializes in electron microscope technology. This microscope features an in-column energy filter equipment, which enables it to collect the highest resolution images attainable from a scanning electron microscope. The energy filter system improves the contrast and resolution of the image by eliminating electrons of certain energies, thus allowing the user to observe finer details and get more accurate results. JEOL JSM-IT 100 also features a large field-of-view, allowing observation of a larger area of the sample. JSM IT 100 has a broad range of applications in both academic and commercial settings. It can be used for image analysis in fields such as materials science, nanotechnology, biology, semiconductor technology, and semiconductor device fabrication. It can analyze particles such as atoms and molecules, and observe different materials. It's also used to observe both conductive and non-conductive samples. JSM IT100 enables investigation of surface features such as grain size, topography, and compositional distribution in various materials. The microscope has several operating modes including low- and high-vacuum modes, dry and wet/low-vacuum modes, scanning mode, and back-scattered electron imaging. It also has several features including variable beam current, automatic beam positioning and current control. In addition, the microscope has an integrated secondary electron detector for increased image contrast and a reduced operational noise level. JEOL JSM IT 100 is ideal for a variety of research applications. The microscope has a high resolution of up to 1.1 nm, enabling the user to observe a range of structures and features. The resolution can be further increased by combining several scan modes. JSM-IT 100 is equipped with a motorized stage which allows the sample to be moved and scanned in any direction. This makes it easy to investigate large areas quickly and efficiently. JEOL JSM IT100 can be used in a variety of imaging modes, including optical, backscattered electron, and secondary electron imaging. It also has several accessories like a low-vacuum preparation unit and a Peltier controller board which can be used to adjust temperature in the sample chamber. The microscope has an additional high-resolution digital color camera for making digital images. The microscope has both English and Japanese menus, making it easier to use. It also comes with an advanced software program, allowing a variety of functions and operation. In conclusion, JEOL JSM-IT 100 is a scanning electron microscope designed for a variety of research applications. It delivers excellent images with high resolution and contrast and has a range of operating modes for easy image analysis. With its field of view, motorized stage, low-vacuum preparation machine, and advanced software, JSM IT 100 is a powerful and reliable tool for researchers in many different disciplines.
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