Used JEOL JSM IT500 HR #293747829 for sale

ID: 293747829
Vintage: 2018
Scanning Electron Microscopes (SEM) Backscatter EDAX EDS Detector Low vacuum mode 2018 vintage.
JEOL JSM IT500 HR is a scanning electron microscope (SEM) designed for high resolution imaging and analysis. It has a field of view of up to 13 mm and an acceleration voltage of up to 30 KV. It utilizes a new flat-plane type elliptical electrostatic lens with a newly developed electromagnetic doublet lens for high resolution imaging with its unique well-controlled spherical aberration (CSA) characteristics. This CSA enables a 3D dynamic focusing on the specimen surface, resulting in sharper and higher resolution images. JSM IT500 HR features a new, improved high-temperature stage (HTS) that can be heated up to 500°C and is suitable for analyzing heat-sensitive, heat-processed, or high-temperature samples. This is achieved via a newly developed liquid nitrogen cooling element without requiring liquid nitrogen cooling. It also has a new precise coarse zooming/fine zooming mechanism that allows accurate positioning of the specimen even at a large magnification. This scanning electron microscope also has an improved signal-to-noise ratio for increased analytical performance. JEOL JSM IT500 HR has a high pressure SEM (HPSEM) system with a new high vacuum system that can be regulated from 20 to 0.01 Pa. This system is particularly suited for analyzing specimens under high pressure. It is also equipped with a new EDX detector that can detect element compositions with an improved signal-to-noise ratio and increased resolution. Dedicated software with JSM IT500 HR provides custom post acquisition image analysis. This software package helps analyze, measure, and compare features on the images acquired from the microscope. There is also a complementary variety of statistical approximation tools to assist in quantifying results from the analyzed images. Overall, JEOL IT500 HR scanning electron microscope provides users with a powerful imaging and analytical tool based on its unique, high-resolution flat-plane type elliptical electrostatic lens and advanced HTS and EDX features. With the combination of its powerful imaging and analysis capabilities, it is a great tool for research and development in a variety of fields.
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