Used JEOL JSM T300 #293664531 for sale

JEOL JSM T300 is a high performance scanning electron microscope (SEM) designed for imaging and analysis of materials down to the nano-scale level. JSM T300 has a wide range of applications in many different research fields including materials science, crystallography, biomedical, and life sciences. It is equipped with multiple advanced technologies that enable researchers to continue to push the boundaries of scientific discovery. JEOL JSM T300 has a 1kV accelerating voltage rating, giving it the highest equipment resolution available in the 'T-Series' lineup. This is coupled with a variable pressure chamber that can reach pressures as low as 4 Pa, allowing for imaging of even the most delicate sample materials. It is also equipped with a secondary electron detector (SE) with an additional backscattered electron detector (BSE) to capture both high-resolution topographical information and compositional information at the nano-scale. In addition to the two detectors, JSM T300 has several other features that make it an ideal choice for advanced imaging. It has a fast 5-axis motorized stage with X, Y, Z, Rz, and Rn movement capabilities and a large 294mm by 325mm sample chamber. It also has an advanced charged particle beam (CPB) remover and a stage platform with low-vibration function. By using these features, JEOL JSM T300 can perform repeatable imaging and analysis at extremely accurate levels. JSM T300 offers a wide range of innovative features that are designed to enhance its performance. It includes an Energy Dispersive X-Ray Analysis (EDAX) system, a dual-beam autofocus unit, an autotilting stage, a low-vibration stage platform, and a defocused laser beam (DLB) machine to produce high-contrast images. It also has a high-resolution camera with a max resolution of 12 megapixels to capture high-quality images up to 50,000x magnification. Overall, JEOL JSM T300 is an advanced, high-performance scanning electron microscopy tool that is designed for researchers who require the highest levels of imaging and analysis. Its wide array of features, its high specimen chamber capacity, and its variable pressure chamber allow researchers to image and analyze nano-scale materials with the utmost precision and accuracy.