Used JEOL JSM T300 #9174752 for sale

JEOL JSM T300 is a scanning electron microscope (SEM) designed for imaging both organic and inorganic materials for a variety of different research applications. This advanced SEM equipment offers a high resolution imaging capability of up to a 5 nm lateral resolution. JSM T300 has an automated sample positioning system and motorized sample chamber that allow for precise manual or automated sample loading. The total magnification range of this unit is from 10x to 300,000x. JEOL JSM T300 uses two electron beams which produce images in high resolution. The primary electron beam is used to collect the required image information. The secondary electron beam is used for spectroscopic analysis of the sample. The secondary electron beam can be used to detect the elements on the sample surface and can be used for elemental composition analysis. The machine also has an integrated Energy Dispersive X-ray (EDX) spectrometer that provides qualitative and quantitative chemical composition analysis of sampless. The tool also includes an Environmental Scanning Electron Microscope (ESEM) which allows for imaging of wet samples. The ESEM produces excellent images without the need for a vacuum environment. This SEM asset is designed to perform in environmental conditions ranging from atmospheric pressure to 4 Torr. JSM T300 is a versatile and reliable model designed to meet the research needs of a wide variety of industries. This SEM equipment is robust and reliable and offers excellent imaging at the highest resolution. It can be used for a variety of different applications such as 3D imaging, metallurgy, material sciences, and topographical studies. The automated sample positioning system and motorized sample chamber provide accuracy and repeatability in performing a variety of different tasks. This unit is an excellent choice for researchers who require the highest resolution SEM imaging and spectroscopy capabilities in a reliable and versatile machine.