Used JEOL JSM T300 #9252204 for sale

ID: 9252204
Scanning Electron Microscope (SEM) Secondary electron detector for imaging Image resolution: 200 nm at 50,000x magnification Operating voltage: 5 kV to 30 kV.
JEOL JSM T300 is a tabletop scanning electron microscope (SEM) designed for both educational and research applications. It is equipped with a ultrahigh resolution and three-dimensional image capture capability, enabling users to study samples in fine detail. Using JSM T300, samples are placed on the sample holder and then scanned with the electron beam. As the electron beam scans the sample surface, the electrons interact with the sample, causing different signals to be generated. These signals are then measured and analyzed, allowing users to obtain 3D images of the sample at high resolution. The electron beam used in JEOL JSM T300 is generated using astigmatism coils. These coils produce an electron gun with a wide-ranging electron-beam current and reduced magnification at high energies. This beam enables the user to obtain high resolution images at low magnifications, while also permitting a wide range of magnifications and depths of field. JSM T300 also utilizes an Everhart-Thornley detector for the detection of SE (secondary electrons) and BE (backscattered electrons). This detector offers a high sensitivity, allowing the user to precisely determine the surface topography and elemental compositions of the specimen. In addition, JEOL JSM T300 can be equipped with a number of optional accessories, such as EDS (energy dispersive spectrometer) and an in-lens SE detector. These accessories allow users to further enhance the imaging capabilities of JSM T300, enabling them to perform advanced analyses of samples and gain insights into the sample composition. JEOL JSM T300 is capable of operating in a variety of vacuum levels, from <10-7mbar to >10-4mbar. This enables users to work with a variety of samples, including those with low thermodynamic stability. JSM T300 also features an easy-to-use computer interface, which simplifies the operation of the instrument and allows for a quick and efficient acquisition of images. JEOL JSM T300 is an ideal instrument for a range of applications, from biological and materials science studies to everyday task inspections. With its advanced imaging capabilities and a variety of optional accessories, JSM T300 offers users a reliable and efficient tool for obtaining precise and detailed images of samples.
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