Used JEOL JSM T330A #116691 for sale
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ID: 116691
Scanning Electron Microscope with Tracor Northern Z-Max 30 Series TN5502N EDS System
Resolution: 5nm (SEI, 30kV, WD=10nm)
Magnification:
LGS 15x (WD=48mm) -200,000x
SGZ 35x (WD=38mm)-200,000x
Accelerating voltage: 0.5-30Kv
Cooling water: 2L per minute
Power requirement: 100VAC 1Phase 50/60Hz, 2kVA
Constant Current: 20A, Starting Current: 60A
Tracor Northern Z-Max 30 Series TN-5502N EDS system specifications:
Z-Max 30 Series Model: 98-629I3/54S
Controller Model: TN-5502N Assy.:700P117748
Laboratory Resolution: 148.6
Laboratory Peak/BKGD.: 889
Bias Voltage: -400V
Heater Voltage: 10.0
Controller Power Requirement: 115VAC 12A or 230VAC 7A.
JEOL JSM T330A is a scanning electron microscope (SEM) that utilizes an electron beam to analyze the surface of a sample. Its features allow for high resolution imaging and three-dimensional imaging for a variety of samples. JSM T330A operates on a 15kV electron source and has a maximum resolution of 0.3 nanometers, allowing for the highest resolution imaging of small samples or areas. Additionally, it utilizes a motorized stage sensor and photomultiplier tube to acquire digital images of the sample, enabling real-time measurement and accurate sample analysis. The motorized stage sensor can also be programmed with specific operations, allowing for automatic operation of scanning and sample alignment. JEOL JSM T330A is capable of creating ultra high-definition images, due to its integrated backscattered electron detector (BSD). This device is capable of collecting a wide range of detectors and making them available to the user in order to analyze the sample in different ways. JSM T330A also offers a range of filters and plates to allow for easier analysis of both organic and inorganic samples. JEOL JSM T330A is equipped with a multi-element EELS detector; this feature allows for enhanced imaging at the atomic scale and identification of elements present in the sample. This feature is extremely useful in the study of energy-dispersive spectroscopy (EDS) and X-ray spectroscopy. JSM T330A also offers a range of orientation and rotation capabilities, allowing for sample manipulation during analysis. This feature is highly useful for imaging three-dimensional samples and objects, particularly in complex structures. Finally, JEOL JSM T330A is built with an inbuilt gas vacuuming and ionization system which prevents sample contamination. This system is extremely useful for environmental scanning and electron microscopy, allowing for the analysis of samples in real-time. Overall, JSM T330A is an extremely useful scanning electron microscope that offers high resolution imaging and complete sample analysis. Its features allow for the automatic operation of scanning and sample alignment, as well as real time analysis of both organic and inorganic samples. Additionally, the built-in gas vacuuming and ionization system is extremely helpful in keeping the sample uncontaminated and allows for the analysis of complex samples in real-time.
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