Used JEOL JSM T330A #9003668 for sale

JEOL JSM T330A is a Scanning Electron Microscope (SEM) used for high resolution imaging and analysis of materials. It uses a highly focused beam of electrons to scan a sample's surface and collect detailed information. The microscope is equipped with a variety of advanced features and components, making it a versatile analytical tool for a wide range of industrial, biological and medical applications. The microscope is built on an advanced X-Y-Z scanner that provides precise motion control and sample positioning. It also features a large area automated sampling stage for increased sample area coverage. The microscope utilizes a 20 to 30 kV electron column with an acceleration voltage range of 0.1 and 30 kV. It also features a solid state backscatter detector that allows for a wide range of analysis types, including Backscatter Electron (BSE), Secondary Electron (SE), and Stochastic Assisted Imaging (SAE). The microscope further features an Energy Dispersive Spectroscopy (EDS) detector that enables elemental analysis of samples. JSM T330A has an image resolution of 1 to 5 nm and a working distance of 150mm. It is equipped with an environmental/vacuum chamber that can be operated in both vacuum or a pressure range of 4 x 10-6 to 3 x 10-3 Torr. This allows for a wide range of sample substrates to be examined. The chamber also contains a stage ramp temperature controller for working in temperatures ranging from -128 to 250oC. JEOL JSM T330A has a convenient user interface that facilitates easy sample handling. It provides a variety of imaging, analysis, and automation control options for maximum flexibility. It is a general purpose platform that is well suited for a broad range of fields, including material science, electronics, and medical research. It is especially well suited for the analysis of advanced materials with complex features.