Used JEOL JWS 7500 #9130302 for sale

JEOL JWS 7500 is a high-precision scanning electron microscope (or SEM) that enables the viewing and characterization of highly detailed images of microscopic specimens down to the level of individual atoms. The instrument uses a low-energy beam of electrons to rapidly scan the specimen's surface and reveal complex three-dimensional features in extreme detail. The result is a highly detailed, three-dimensional map of the specimen's surface that reveals unique features not visible under a light microscope. JWS 7500 features a wide range of imaging and detectability options to meet the needs of researchers in a variety of fields. These include high-resolution imaging and elemental analysis capabilities, which enable scientists to determine the chemical composition of samples, as well as nanoscale imaging and analysis capabilities, enabling researchers to conduct highly precise measurements at the level of individual atoms. The equipment is based on a large, high-precision Cs-corrected scanning electron column, which is capable of producing highly detailed images at resolutions as low as 0.35 nm. The column is optimized for imaging and analysis of samples ranging from moderate to very large in size, and features a range of advanced sample manipulation tools, including an open-ended Sputtered Coating System (SCS), which is useful for coating fragile samples to protect them from electron beam damage. JEOL JWS 7500 is also capable of imaging and analyzing high-aspect-ratio materials such as carbon and graphene sheets, as well as conducting some scanning acoustic microscopy (SAM) experiments for imaging ultra-thin silicon and other brittle materials. Additional features include a detector-angle adjustable unit to optimize imaging conditions, advanced tilt-correction capability, a deflection control machine, and a host of other features. JWS 7500 is an excellent choice for researchers and scientists requiring a high-performance SEM for imaging and analysis of samples down to the level of individual atoms. The tool is capable of producing extremely detailed 3-dimensional images of sample surfaces, enabling researchers to accurately characterize samples even at nanoscale levels. Additionally, the asset offers a range of advanced imaging and analysis options to meet the needs of users in a variety of fields, making it a valuable and versatile tool for use in both research and industrial settings.