Used JEOL JWS 7500E #293761017 for sale

JEOL JWS 7500E Scanning Electron Microscope (SEM) is a formidable tool for high-resolution imaging and characterization of a wide range of materials. It features a Cold Field Emission Gun (CFEG) with a tungsten filament emitter that generates a focused beam of electrons at a very fine level. The SEM also comes equipped with an automated, full-featured EDS (Energy Dispersive Spectrometry) system for elemental analysis. JWS 7500E provides astonishingly high resolution imaging with a resolution down to 1nm, improved depth of focus and the ability to collect micrographs at a variety of magnifications. JEOL JWS 7500E is also equipped with a wide range of multi-mode detectors that allow the user to image both in-plane and out-of-plane surface features ranging in size spanning from 5nm to 1um. In addition to high-resolution imaging, the SEM allows for novel, through-the-lens second-harmonic generation and cathodoluminescence investigations. This allows for the nondestructive characterization of the laser-induced surface plasmon-resonance and local strain efforts of a material. The user is also able to do dimensional measurements of materials using the included automated stage movement and fine focus control options. JWS 7500E also offers environmental options such as atmospheric-pressure SEM (AP-SEM) and low vacuum operation, allowing for investigations of samples in their natural state. This microscope is also equipped with a superior micro-manipulator and nanomanipulator featuring 3D capability and 10nm resolution control, allowing for manipulation of the electron beam to produce crisp, accurate images with low magnification. JEOL JWS 7500E is a reliable and robust tool with superior imaging and analytical capabilities. With its ease of use and versatile applications, it is an ideal device for any scientist or researcher in the fields of materials sciences or electron microscopy.