Used JEOL JWS 7500E #9224662 for sale

JEOL JWS 7500E is a scanning electron microscope (SEM) optimized for high-resolution imaging. It offers a wide range of options to enhance imaging capabilities and provide accurate measurements that are reproducible. This scanning electron microscope is equipped with a powerful shape-corrected objective lens and an automated stage to allow for greater accuracy and higher contrast imaging. JWS 7500E has an integrated beam alignment equipment which helps ensure accurate beam placement. JEOL JWS 7500E offers an integrated scanning system that is capable of providing images with resolution up to 2nm. The unit also has an additional field emission electron source for higher resolution imaging. This machine is capable of fast scanning electron detections and can handle a wide range of particles such as organic compounds and non-metallic objects. Another feature of JWS 7500E is the electron backscattering channel that can provide contrast and depth perception. JEOL JWS 7500E is equipped with a manipulator, which allows the user to handle hard-to-reach samples, ensuring that the specimen is not damaged during analysis. The manipulator can accommodate a variety of sample sizes and shapes, including rotating and tilting capability. The automated sample stage also helps provide a consistent and repeatable environment for observation and measurements. JWS 7500E also offers an advanced image processing software package that allows the user to analyze different parameters of an image. This package is capable of measuring area and volume, counting particles, and segmenting objects according to colour and texture. The software package also features 3D reconstruction capabilities, which can provide engineers with further detail and clarity of processed images. JEOL JWS 7500E's optional software package can also offer a range of integrated analytical techniques. These techniques include energy-dispersive X-ray spectroscopy (EDS), X-ray micro-analysis, and cathodoluminescence (CL). These techniques help to enhance the imaging resolution and provide valuable chemical information for further analysis. JWS 7500E is an excellent scanning electron microscope that provides outstanding image quality and incredible durability. In addition to its advanced imaging capabilities, it also offers a range of analytical techniques, to help the user get more useful information from their samples. JEOL JWS 7500E provides a valuable tool for several applications such as material research, semiconductor and electronics study and biomedical research.