Used JEOL JWS 7500E #9299482 for sale

JEOL JWS 7500E is a high-performance Scanning Electron Microscope (SEM) that offers top-of-the-line imaging performance and versatile applications. This scanning electron microscope employs an everhart-thornley secondary electron detector, which provides high sensitivity and low noise imaging. Additionally, JWS 7500E comes with a standard backscatter electron detector, allowing users to acquire secondary as well as backscatter electron images, as well as detecting relative abundance of elements in a sample. JEOL JWS 7500E also features an EverNew SEN digital camera that provides high resolution imaging at pixel resolutions up to 2,048 x 2,048. This digital camera is equipped with a 30-bit internal video processor and a liquid nitrogen cooled solid-state CCD sensor to provide the highest level of signal/noise ratio. Furthermore, JWS 7500E boasts an advanced normal beam Z-functioning and high-resolution secondary electron (SEM) imaging. JEOL JWS 7500E Scanning Electron Microscope is also equipped with a vacuum equipment, which is specifically designed for high-resolution SEM and Backscatter Electron Imaging (BSEI). This vacuum system is equipped with a turbo molecular drag ion pump as well as a rotary vane, turbo-molecular drag and ion pumps that allow for ultra-high vacuum operation. JWS 7500E also comes with an auto-sampling unit, enabling the rapid and convenient transfer of specimen samples between imaging locations. In addition, JEOL JWS 7500E Scanning Electron Microscope provides a variety of techniques including Electron Backscatter Diffraction (EBSD) capability and Energy Dispersive X-Ray Microanalysis (EDXMA). This SEM also offers a choice of seven accelerating voltages ranging from 5 to 30 KV, allowing for a wide range of imaging applications. Furthermore, this SEM also features a host of advanced analytical features that make imaging and analysis quicker and easier such as Modulogic Series technology, which allows users to quickly adjust the microscope's parameters for improved performance. Overall, JWS 7500E Scanning Electron Microscope is an exceptionally powerful instrument that offers high resolution imaging as well as versatile and powerful analytical features. This scanning electron microscope's vacuum machine, imaging capabilities and analytical features make it an excellent choice for those in the industries of electronics, materials science and life sciences.