Used JEOL JWS 7505 #293594310 for sale

JEOL JWS 7505 Scanning Electron Microscope (SEM) has a 3.2 nanometer resolution and a high level of performance compared to other SEMs. It features an advanced Field Emission Gun (FEG) with an enlarged chamber, a beamsplitter structure and an in-column energy filter. This allows the user to acquire a higher magnification and higher depth of field, resulting in a higher level of detail for an image. JEOL JWS-7505 also provides a wide range of observation modes and capabilities, such as scanning tunneling microscopy (STM) as well as in-situ manipulation and analysis of specimens with improved operation capabilities. The equipped detector system is configured to provide faster image resolution, improved image fidelity and accuracy, improved 3D imaging, and in-situ sample manipulation, while optimizing the chamber environment. JWS 7505 also has a fast pattern searching and stitching capability, enabling faster image acquisition and higher resolution recordings. The imaging modes of JWS-7505 include secondary electron imaging, backscattered electron imaging, and cathodoluminescence imaging. It is also equipped with a variety of detectors for imaging, including a scintillator detector for in-situ analysis, as well as an energy-dispersive spectrometer, electron backscattered diffraction (EBSD) detector, and angle-resolved energy filter for composition analysis. In addition, JEOL JWS 7505 has a specimen stage with automated observation and sample rotation. It also features a digital image feed using a high-speed transmission, allowing for real-time observation and analysis. JEOL JWS-7505 is optimally designed for operation in a cleanroom environment, meaning it can be used in conditions with no dust or other pollutants. JWS 7505 provides users with a reliable and easy-to-use platform for scanning electron microscopy. Its high-resolution, high-speed imaging, and intuitive user interface make it an ideal tool for a variety of research applications. Its low-cost entry option, coupled with its excellent performance, make it a great choice for scanning electron microscopy.