Used JEOL JWS 7505 #52502 for sale

JEOL JWS 7505 is a scanning electron microscope (SEM) that features advanced imaging and analytical capabilities for specimen visualization and characterization. It enables high resolution imaging and precise measurements on a variety of sample types, including samples that require both low and high vacuum conditions. This beam imaging and analysis equipment is suitable for a wide range of applications, from simple imaging and analysis to complex, multi-dimensional SEM studies. The scanning electron microscopy (SEM) system is built on an advanced 65mm, 2kV field emission gun. This high-resolution imaging device provides outstanding resolution and contrast, enabling highly precise imaging and analysis of even the smallest features, such as nanometer-scale particles. The unit has an automatic focus control feature that allows users to keep their samples razor sharp without manual adjustment. JEOL JWS-7505 is equipped with a multipurpose photoelectron spectrometer, which can perform quantitative and qualitative analysis of specimens using energetic techniques, such as XPS, UPS, AES, and Auger electron spectroscopy (AES). This provides researchers with a detailed analysis of a specimen's composition and distribution of elements, which gives insight into the material's structure, properties, and possible applications. In addition to the spectrometer, the machine features an energy dispersive X-ray (EDS) microspectrophotometer for elemental analysis. This allows for quick and targeted X-ray elemental analysis in a variety of sample types max medium to high vacuum conditions. The tool also includes a high-speed, high-contrast detector that provides 6-megapixel, still images with up to 20,000X magnification. This detector is capable of recording live video up to 30 frames per second, so researchers can analyze dynamic processes in fast-moving samples in their full context. The instrument is fully automated and integrates all of its components into a single, easy to use platform. It is designed for observation of all types of samples, including liquids and gasses. This makes it an ideal solution for research in nanotechnology, materials science, semiconductor technology, and biomedical research.