Used JEOL JWS 7505 #9000172 for sale

JEOL JWS 7505 is a scanning electron microscope (SEM) designed to provide high-resolution imaging and analysis. It has a field emission gun (FEG) source with a accelerating voltage up to 30 kV, and a large working distance of 170 mm. In addition, the sample chamber is equipped with a 4-axis scanner and a stage tilt controller. The detector system is comprised of a back scattered electron detector (BSE), an X-ray detector (EDX), and a secondary electron detector (SE). The BSE detector has a high resolution of 8 nm, an active area of 15 x 15 mm and an angular acceptance of 15 degrees. The EDX system has a spectral resolution of 300eV and a maximum acceleration voltage of 15 keV. The SE detector has a high resolution of 8 nm. JEOL JWS-7505 is capable of producing high-contrast images and 3D surface profiles in both the lateral and vertical directions. The SEM also has an auto-alignment feature that ensures the accuracy of the images and measurements. The unique combination of high-resolution imaging capability and analysis tools makes JWS 7505 an ideal tool for research, development, and production in the materials science and engineering fields. With its high-resolution images and magnification capabilities, JWS-7505 can be used to analyze the structure and composition of materials with amazing detail. It can also be used to study the surface topography of materials, including particles and microstructures. The image analysis and quantification capabilities of JEOL JWS 7505 enable detailed characterization of materials and surfaces, allowing for better understanding of their properties. In addition, JEOL JWS-7505 includes optional EDS and EBSD systems for further elemental analysis. In summary, JWS 7505 SEM is a powerful and versatile tool for high-resolution imaging and analysis of materials and structures. With its array of features and capabilities, JWS-7505 is well suited for research, development, and production in many different industries.