Used JEOL JWS 7505 #9196807 for sale

ID: 9196807
Scanning Electron Microscope (SEM) With THERMO NORAN EDX.
JEOL JWS 7505 Scanning Electron Microscope (SEM) is a complex imaging instrument that utilizes electrons to create high resolution, three-dimensional images of a variety of sample types. The 7505 SEM is seeking to revolutionize imaging, characterization, and materials analysis at the nanoscale. This innovative SEM is designed for precision images in a variety of conditions and can accommodate a wide range of specimen sizes from small to extra large. The 7505 features a unique digital electron column, servo-controlled electron gun, and aberration-corrected high performance polepieces to ensure enhanced performance. These features improve resolution to reach 0.81 nm image resolution. In addition, the 7505 is equipped with a high power source and the ability to serve up to 6 detectors. The built-in energy filtering system eliminates all but desired elements from the images, allowing for improved clarity. The integrated digital magnification system accommodates any type of specimen, providing a range from 7.5x to 8000x. With the addition of new and groundbreaking technologies, the 7505 continues to provide superior imaging and optimal resolution with improved distortion control and the highest signal to noise and contrast ratios. The 7505 also offers automated features to improve workflow. A powerful pattern matching feature links the information acquired to corresponding spectra and helps users interpret their data with greater accuracy. Also included is the Focus Hunt mode which allows users to capture specimens that are difficult to focus by horizontally and vertically adjusting the specimen stage. Finally, the 7505 incorporates the revolutionary TSP™ (Time Stack Processing) which enables researchers to obtain 3D images directly from the collected SEM images. This eliminates the need for any STM or AFM systems and provides researchers with an all-in-one platform for nanoscale imaging and characterization. Overall, JEOL 7505 Scanning Electron Microscope is an advanced imaging tool that provides high quality images with improved resolution and contrast, along with more efficient workflow and automated features. With the help of the 7505, researchers can easily tackle some of the most difficult imaging jobs with confidence.
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