Used JEOL JWS 7505 #9278048 for sale

JEOL JWS 7505 is a top-of-the-line scanning electron microscope (SEM). With its high resolution, compatibility with a variety of sample types, and advanced imaging capabilities, it is the ideal instrument for many industrial and research applications. In terms of physical composition, the base model JEOL JWS-7505 features an ultra-stability-designed variable pressure SEM column, a high resolution cold field emission electron source, a 5-position sample changer, and a 9-inch generation 2 Schottky field emission electron source. Moreover, the model is equipped with ultra-wide-field technology, modular ion-detector units, and a high stability magnetic field plate for electron optics positioning. In terms of analytical capabilities, JWS 7505 is capable of high resolution and high contrast imaging and spectroscopy, such as energy dispersive spectroscopy (EDS), electron backscatter diffraction (EBSD) and wavelength dispersive spectroscopy (WDS). Likewise, it is capable of analytical functions such as automated imaging, automated elemental mapping, automated measurement, and automated post-process data extraction. Furthermore, in terms of sample preparation, JWS-7505 is capable of various traditional sample prep techniques, such as vacuum mounting, conventional vacuum coating, and cryo-fracture co-focused ion beam slicing. The electron beam itself can be varied in width of up to 1000 µm. Moreover, there are various accessories that expand its sample prep capabilities, such as a liquid nitrogen temperature-controlled etching stage, a dual column vacuum fume hood and glove box, and a precision micropositioning stage. All in all, JEOL JWS 7505 is an incredibly sophisticated scanning electron microscope that is capable of delivering high quality results to many industrial and research applications. Its combination of physical composition, analytical capabilities, and sample preparation capabilities make it one of the most sought after SEMs available on the market.