Used JEOL JWS 7515 #293628742 for sale

JEOL JWS 7515 is a scanning electron microscope (SEM) that provides excellent detail imaging and analytical capabilities. It uses a powerful combined field emission gun (CFE) and low voltage SEM column to give a high level of performance. In addition to the basic scanning electron microscope capabilities, JEOL JWS-7515 offers a series of advanced features. It is optimised for high resolution imaging and high magnification capabilities and has an innovative peak temperature control equipment which ensures stable operation over a wide range of operating conditions. The microscope also has an advanced nano beam system which enables ultra-high resolution imaging and analytical capabilities. JWS 7515 also has a flexible darkfield detector which allows for high quality darkfield imaging. The detector enables ultra-low working distances which allow for better sample observation and analysis. Additionally, the microscope has a versatile energy-dispersive spectrometry (EDS) unit with a high dynamic range and spectral resolution which provides precise elemental data. JWS-7515 also includes a number of accessories which further enhance its performance. The 2D-Cryo sample holder and Vacuum Exchange Machine allow for high resolution imaging at low temperatures and the On-the-Fly Scanning Tool ensures continuous imaging with no breaks in scan rate. JEOL JWS 7515 scanning electron microscope offers superior imaging and analytical capabilities due to its advanced features. Its variable accelerating voltage allows for finely detailed images and the integrated EDS asset gives reliable elemental analysis. It is a reliable instrument designed to provide a detailed insight into a range of samples.