Used JEOL JWS 7515 #293717495 for sale

JEOL JWS 7515 is a scanning electron microscope (SEM) with a tungsten filament source for high resolution imaging. It offers a magnification of up to 250,000x and has a field of view of 50nm for impressive imaging results. JEOL JWS-7515 is equipped with two collectors for backscattered electrons and secondary electrons and includes both X-ray and energy dispersive X-ray spectroscopy (EDS) options. The microscope also has an automated stacked imaging capability, allowing users to quickly conduct multiple imaging and spectroscopy tasks at once. This allows higher throughput and deeper analysis of samples. With a 15kV accelerating voltage, JWS 7515 can image insulating samples as well as direct current (DC) or radio frequency (RF) studies. The SEM also offers a viewing chamber for easy sample handling and positioning, as well as a monochromatic imaging option for contrast control. The microscope includes both a high- and low-magnification camera for convenient monitoring of specimens. This Is enabled by JEOL SmartScan auto-alignment system to quickly adjust the SEM's focus during the imaging process. JWS-7515 has an environmental chamber with a temperature range of -180C to +130C, enabling temperature manipulation of specimens. This, combined with the 45-degree tilt stage enables 3D imaging of samples. The associated software has low-dose imaging capabilities to maintain sample integrity as well as many user-friendly control and data acquisition and management tools. JEOL JWS 7515 is suitable for a variety of research applications such as micromechanical studies, failure analysis, biological sample characterization, surface element analysis, and much more. The combination of features such as high resolution imaging and the low-dose technology make the SEM an ideal tool for high quality imaging and analysis.