Used JEOL JWS 7515 #84046 for sale

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ID: 84046
SEM Field emission electron gun EDS detector with cryo compressor (LN2 free operation) Resolution: 8 nm Magnification: 100X to 200,000X Accelerating voltage up to 12 kV 4-Axis goniometer stage.
JEOL JWS 7515 is a scanning electron microscope (SEM) that features a magnetic field emission source and outstanding tungsten filament for high resolution imaging up to 15 nanometers. JEOL JWS-7515 features a versatile equipment design with a built-in manipulation arm for sample loading, a digital flat panel display, and powerful integrated software for image acquisition and analysis. JWS 7515 has a large chamber size of 25 cm by 25 cm, which allows for flexible and reliable sample loading in a wide variety of applications. The variable-pressure design of JWS-7515 allows users to control the working distance and electron beam current, allowing for greater accuracy and resolution in imaging. JEOL JWS 7515 is capable of imaging a range of sample topologies to include high-resolution surface and interior material characteristics, elemental distributions, and textured or crystalline structures. JEOL JWS-7515 also features advanced technology including detection of backscattered electrons, reflected electrons, and x-rays; and high resolution imaging. The scanner also has a high resolution motorized stage for precise control, high sensitivity digital displays, and full automation of the imaging process. JWS 7515 can be connected to PC or workstation for powerful analysis, data management, and automated operation of the system. JWS-7515 can be operated at both lower and higher vacuum modes in order to obtain highly accurate and relevant results for a range of applications. It has an ultra-high resolution of 15 nanometers, and its scanning speed is higher than that provided by most competitively-priced SEMs, making it an ideal choice for users who need an in-depth and accurate imaging unit. Additionally, JEOL JWS 7515 can be programmed to automatically optimize image settings according to the desired application. Overall, JEOL JWS-7515 is a state-of-the-art scanning electron microscope the provides the user with flexibility and control of imaging. It is well suited for applications involving nanoscale imaging and exact resolution and has automated imaging functions with high levels of accuracy. Its large chamber size and versatility provide users with a reliable imaging machine to produce high resolution images in a wide range of applications.
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