Used JEOL JWS 7515 #9220978 for sale

JEOL JWS 7515 scanning electron microscope is a highly advanced analytical tool designed to measure structural and elemental composition with extraordinary resolving power. It uses electron beams generated from a tungsten electron-gun to obtain highly detailed images of microscopic objects. The high resolution imaging capability of this instrument is valuable for a wide range of research, including analysis of materials, biomolecular structure and chemical composition. JEOL JWS-7515 scanning electron microscope features a unique combination of high brightness, large field of view and high magnification. Its high-energy electron beam source is capable of magnification levels up to 3000x, providing precision imaging down to the nanometer scale. This powerful microscope also features a large dynamic range of field of view, allowing a large area of analysis to be studied in detail. Additionally, it provides a wide range of advanced analytical capabilities like energy dispersive X-ray spectroscopy, electron backscatter diffraction, depth profiling and chemical imaging. JWS 7515 scanning electron microscope is equipped with an automatic focus control equipment which ensures optimal imaging conditions. This system combines a computer-controlled focus adjustment with a stage drive controller which allows precise and accurate sample scanning. In addition, a combination of objective lens and backscatter detector systems optimize the imaging quality for a wide variety of samples, including those of metallic materials. JWS-7515 scanning electron microscope also features an integrated elemental analysis unit which allows compositional analysis of samples with high accuracy. In addition, it can be used to analyze the contamination levels in samples and to detect the presence of subtle surface defects. Lastly, the machine also features a variety of software tools to facilitate image analysis and sample documentation. Overall, JEOL JWS 7515 scanning electron microscope is a versatile, reliable and efficient instrument ideal for a wide range of research applications. Its impressive resolution and powerful analytical capabilities provide unmatched performance to researchers in the field.