Used JEOL JWS 7515 #9249356 for sale

JEOL JWS 7515 is a high-performance scanning electron microscope (SEM) that enables precision imaging of large samples. With its advanced imaging features and highly accurate analysis capabilities, it is an ideal instrument for a wide range of imaging applications. JEOL JWS-7515 features a new 15 nanometer ultra-low-noise performance detector equipment, providing reliable imaging results with low noise. This helps to reduce the occurrence of discolorization on SEM images, and provides faster image capture. It also features a 5-axis sample stage for optimum imaging of large samples, with the ability to tilt and rotate the sample during the imaging process for the highest possible detail. JWS 7515 also includes automated detection and focussing capabilities for precision scan results. Its user-friendly Automated Sample Environment Control (SEM-CON) system allows for precise and reproducible methods to be developed easily and quickly. It also features an improved optical unit for increased sample stability and improved imaging sensitivity. Furthermore, JWS-7515 also features advanced data analysis capabilities. With its dedicated application software, users can analyze elemental composition, image morphology and grain size from the acquired data. It also features a particle analysis machine which allows for precise analysis of individual particles down to the nanometer scale. Overall, JEOL JWS 7515 offers a versatile and reliable solution to imaging needs. With its advanced detector tool, automated capabilities for accuracy and reproducibility, and robust data analysis capabilities, it is an ideal instrument to enable high-level imaging and precise analysis for a wide range of processes.