Used JEOL JWS 7515 #9256119 for sale

JEOL JWS 7515 scanning electron microscope is a powerful tool for imaging and analyzing samples at the nanometer scale. It combines high resolution imaging and analytical capabilities in a single equipment platform. The equipment features an acceleration voltage up to 30 kV for improved resolution and low voltage detection capability for sensitive specimens. This scanning electron microscope is equipped with EDAX's EDS (Energy Dispersive X-ray Spectroscopy) system which allows for superior elemental identification. The detector is physically and digitally coupled with JEOL SEM to provide operator flexibility and ease of view control. JEOL JWS-7515 scanning electron microscope offers an efficient and easy to use interface, with a touchscreen and intuitive control features. It provides a full range of imaging modes including SEI, SE2 (secondary electrons), BSE (backscattered electrons), BSED (Backscatter Electron Diffraction), EDS (Energy Dispersive X-ray Spectroscopy), EBSD (Electron Backscatter Diffraction), EFTEM (Electron Energy Loss Spectroscopy) and Analytical STEM (Scanning Tunnesting Electron Microscopy). JWS 7515 scanning electron microscope is designed for a broad range of materials such as biomaterials, polymers, metals, alloys, ceramics, glasses, and so on. This versatile SEM offers both high resolution imaging as well as quantitative elemental analysis with an X-ray detector. Measurements can be taken quickly and accurately in both conductive and non-conductive materials. JWS-7515 scanning electron microscope conveys a high precision positioning unit, with nanometer-level repeatability, allowing quick and accurate navigation of the specimen. The high dielectric shielding helps reduce specimen charging artifact and allows optimum voltage, beam current, and emission to be applied. It also delivers high speed data acquisition and analysis with a wide range of built-in software packages, allowing operators to quickly and accurately assess images and data from the SEM. Additionally, the software offers a range of user-friendly image analysis tools and specialized application modules, such as FEG-STEM Analyzer, Automation and CAD comparison. JEOL JWS 7515 scanning electron microscope provides a reliable imaging and analytical machine with high accuracy and repeatability. It is a reliable tool for industry, research, and academic settings. This SEM is a powerful tool for materials science study and offers a wide range of imaging capabilities.