Used JEOL JWS 7515 #9298655 for sale

JEOL JWS 7515 scanning electron microscope is a high precision instrument used for advanced scientific and industrial research. It is capable of sub-nanometer resolutions, allowing for detailed characterisation of the nanometer-scale structures of many materials. It is equipped with a Field Emission Gun and digital PC controller, providing reliable performance and versatility. JEOL JWS-7515 is designed for maximum versatility and user friendliness, making it ideal for a wide range of activities such as analysis of material courses, damage analysis, failure analysis, assembly process, metallography, etc. Its standard resolution is 0.5nm, allowing for high resolution imaging of nanoscopically sized structures. The device offers following advantages such as non-contact imaging of a larger field of view, extensive flexibility for specimen observation, four-dimensional measurement capabilities (X, Y, Z and Energy), and excellent repeatability. It also features optional add-on software tools which allow for automatic image processing and quantification. The device is equipped with JEOL EDS detector which provides superior resolution and fast analysis of chemical composition and distribution. The device also offers a wide range of imaging modes, such as secondary electrons, backscattered electrons, cathodoluminescence, and in-lens detectors. JWS 7515 is ideally suited for a broad range of industrial, research, and educational applications. It combines excellent image quality, accuracy, and resolution, while offering complete flexibility in users' imaging and analytical needs. Moreover, the device comes with user-friendly graphical user interface and a variety of helpful operating features, making it easy to use for a broad range of operators.