Used JEOL JWS 7515 #9392789 for sale

JEOL JWS 7515
ID: 9392789
Scanning Electron Microscope (SEM).
JEOL JWS 7515 is a scanning electron microscope (SEM) offering excellent image quality and analysis capability. It provides superior high-resolution, low-magnification imaging of surface features down to the atomic level. The 7515 is equipped with a wide range of analytical techniques for energy dispersive spectroscopy (EDS), wavelength dispersive spectroscopy (WDS), cathodoluminescence (CL) and electron backscatter diffraction (EBSD). The 7515 has a wide, specimen chamber and the ability to accommodate a variety of sample sizes and shapes. The large chamber works in conjunction with its automated specimen handling to allow for efficient sample positioning. It also allows for operation in multiple modes such as ultra microtomy (UMT), critical point dry (CPD) and low vacuum (LV) STEM imaging. The 7515 has an in-column energy filtering option, allowing the user to select the best analytical features for their chosen applications. The on-axis electron gun provides up to low voltages for reduced structural damage. The high degree of electron beam stability results in superior signal-to-noise ratio for low-voltage images, reducing the risk of sample damage and allowing for maximum specimen preservation. The 7515 offers excellent automated image acquisition control and easy automated manipulation of the specimen stage. It includes user-friendly graphical user interface (GUI) software with a range of analytical and visualization capabilities for EDS, WDS, CL and EBSD. The 7515 can operate in multiple noise reduction modes to minimize image artifacts, reducing the need for manual image adjustments. Its high resolution and analysis capability make JEOL JWS-7515 a powerful tool for reviewers in many scientific and academic fields and its versatility makes it suitable for a wide variety of research needs. Its stable electron gun and user-friendly software make it an easy choice for new users. Its advanced analytical capabilities and automated specimen handling systems make it a powerful tool for advanced users.
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