Used JEOL JWS 7515 #9399595 for sale

JEOL JWS 7515 is a state-of-the-art scanning electron microscope (SEM). It is designed to provide high resolution imaging and detailed analysis of a variety of samples, including biological and inorganic specimens. The microscope features a field emission gun that provides superior performance and stability when used with a high degree of magnification. The gun also produces a high-sensitivity secondary electron detector, enabling detailed imaging in both low- and high-vacuum environments. Additionally, JEOL JWS-7515 is equipped with a unique variable-pressure equipment that allows the user to adjust the pressure of the chamber without drastically changing the resolution of the image. JWS 7515 provides a wide range of imaging and analytical capabilities, such as backscattered electron (BSE) imaging, corrosion imaging, cathodoluminescence imaging, energy-dispersive X-ray spectroscopy (EDS), and directed-beam cathodoluminescence. BSE imaging gives the user the ability to distinguish between different elements in the sample, while corrosion imaging can show the presence of corrosion on a specimen. Cathodoluminescence imaging is used to analyze samples emitted from an electron beam, while EDS can be used to determine the composition of the sample. The microscope's directed-beam cathodoluminescence is particularly helpful for imaging specimens that have a high content of organic material. JWS-7515 also includes a secondary electron detector that can be used to acquire high-resolution images of material's surface structure and to detect surface topography. The microscope's low-vacuum setting provides superior imaging without sacrificing resolution, while its high-vacuum setting enables imaging in ultra-high magnification. The microscope also includes an in-lens navigation system to allow users to easily control the microscope's field of view. Additionally, JEOL JWS 7515 includes a wide range of software packages, such as the EasyScan 3 unit and an open-source software platform, to provide users with extensive options for post-processing their images. In summary, JEOL JWS-7515 is a sophisticated scanning electron microscope designed to provide superior imaging and detailed analysis of a variety of samples. The microscope features a field emission gun, a secondary electron detector, and a variable-pressure machine, allowing users to accurately image a variety of sample types. Additionally, JWS 7515 includes a wide range of software packages for post-processing images, making it an excellent choice for users looking for a high-quality SEM.