Used JEOL JWS 7550 #137194 for sale

JEOL JWS 7550 is a scanning electron microscope (SEM) that is used to visualize objects at the nanoscale. It is equipped with a 3.2 nanometer resolution imaging system which provides high-resolution images of a variety of sample types. It is capable of operating in either low-energy or high-energy modes depending on the type of sample being observed. The system is accessible through a user-friendly software interface. This intuitive interface allows for quick sample operation and adjustment procedures. The software can also be used to create detailed images of sample surfaces, allowing for precise analysis. Additionally, a range of other analysis functions are available such as elemental mapping, line profile scanning, X-ray analysis and electron backscatter imaging. JWS 7550 provides an easy to use platform for quick analysis of samples that require intricate detail and analysis. In terms of design, JEOL JWS 7550 consists of a column, base, and gun assembly. The base is made from a die-cast aluminum frame with an anodized finish for durability and ease of cleaning. The column is constructed from a machined aluminum alloy with a rigid design for reliable performance. The gun assembly consists of an electron gun, electron source, and sample substrates for observation. A capacitance diaphragm is also installed for filter and isolation of the electron beam. JWS 7550 is constructed to be maintenance-free and self-performance tested to ensure every unit is performing optimally. Furthermore, a full range of accessories are available to aid in sample preparation and analysis. The wide variety of imaging techniques makes this SEM an ideal choice for a variety of research needs. JEOL JWS 7550 is a powerful imaging tool that provides invaluable insight into the structures and properties of nanoscale particles. Its ability to produce resolution on par with other SEMs while providing users an intuitive interface makes it an excellent choice for use in a variety of research applications.