Used JEOL JWS 7555 #293758236 for sale

JEOL JWS 7555 is a scanning electron microscope (SEM) for research and industrial applications. The microscope combines high resolution imaging and advanced analysis functions for a wide range of SEM applications. It features an ultra-high vacuum equipment allowing for imaging of delicate samples, as well as a wide range of detectors and accessories for ideal imaging conditions. JWS 7555 utilizes a variable pressure SEM (VP-SEM) structure to offer flexibility, with an observation chamber pressure range of 0.1 to 400 Pa. The VP-SEM allows stable imaging at relatively high pressure, which aids in the prevention of image distortion due to charging. An ultra-wide field (UWF) eyepiece lens is included to provide a clear, large picture of the sample, while the advanced stage vibration damping system provides stable images. The microscope also comes equipped with a range of detectors and accessories, such as SE, BSE, range detector, and CCD. JEOL JWS 7555 is compatible with automatic mapping and X-ray analytical systems, allowing for easy analysis of samples. An advanced image processing technologies includes Pixel-By-Pixel Analysis for measuring area and edge position accuracy, as well as image filters for advanced image manipulation and analysis. For sample preparation, JWS 7555 includes an automated sample feeder, an automated sample drying unit, and an integrated CO2 flash heating machine. A sample diameter holder with a tip acceleration voltage up to 45kV provides a low-smearing, high-resolution imaging environment suitable for electric analysis. An integrated automatic SEM gun alignment tool for high-accuracy tilt adjustment and repeatability of the detector is also included. The entire asset is controlled via a hardware panel and Windows-based PC controller, which provides a high-function user interface and top-level performance. The microscope is frequently used in the fields of material science and life science, as well as industrial inspection and quality control. It is designed to fulfill a wide range of imaging and analysis needs.