Used JEOL JWS 7555 #293791443 for sale

JEOL JWS 7555 Scanning Electron Microscope (SEM) is a high-end versatile tool designed to achieve a high level of performance in a variety of research and industrial applications. The 7555 is equipped with an energy dispersive X-ray (EDX) microanalysis equipment, allowing it to identify and analyze elemental composition of specimens down to a sub-micron resolution. The SEM also features variable pressure and environmental operation modes, enabling the user to observe and analyze biological, geological and other materials in a variety of settings. The 7555's high resolution imaging capabilities are impressive, with the unit achieving a resolution of less than 0.5 nm, at acceleration voltage of 15 keV. It also offers a wide field of view and a large depth of field so that multiple layers of a specimen can be observed and analyzed. The maximum magnification is 150,000 times and it offers a drift correction system for stable imaging. It also supports several controlling devices, including a digital camera, an electron beam microscope, and a low vacuum chamber. The powerful EDX unit allows the 7555 to excite and detect X-rays from samples as small as 50 nm in diameter. It is equipped with an energy filter machine to improve the quality of the X-rays and has a detector with a wide dynamic range, allowing it to analyze a wide range of elements. It has both qualitative and quantitative analysis capabilities, allowing it to identify elements in a sample as well as display the relative concentration of said elements. The 7555 is also quite user friendly, with intuitive controls and a feature-rich graphical user-interface. The user can save and recall images, automate their processes, and do screen operations. It also has well integrated safety functions, such as built-in interlocks and real-time status information. With its exceptional range of features, JWS 7555 Scanning Electron Microscope is an ideal choice for a number of industrial and research applications.