Used JEOL JWS 7555 #9298946 for sale

JEOL JWS 7555
ID: 9298946
Wafer Size: 8"
Vintage: 2000
Scanning Electron Microscope (SEM), 8" Wafer inspection tool 2000 vintage.
JEOL JWS 7555 is a high-end scanning electron microscope (SEM) designed for high-resolution imaging and analysis of surfaces and structures. The microscope features a 5nm resolution point-to-point accuracy, allowing it to make detailed images of features that are 20 nanometers in size or larger. The column is optimized for both low acceleration and field emission to ensure maximum performance and resolution. JWS 7555 is equipped with a specialized high-sensitivity ultrafast electron detector which increases signal-to-noise ratios and enables ultra-small images to be taken at extremely low levels of electron illumination. The column also has an adjustable operating voltage, allowing operators to adjust the operational parameters without changing the physical parameters of the SEM. The microscope has an advanced post-processing pipeline, enabling users to analyze and edit the results of their images, increasing accuracy and even allowing for 3-dimensional images and measurements. Additionally, the SEM also features automated interactions to speed up data acquisition tasks, as well as an improved user-friendly interface. JEOL JWS 7555 is optimized for a range of applications, including routine failure and defect analysis, electronics, medical device engineering, and various nanostructures. Its high resolution capability and adjustable electron beam parameters allow for a wide range of measurements including surface and mass analysis, elemental mapping, high-resolution imaging, and signal/noise characterization. As a result, JWS 7555 is the ideal tool for detailed failure analysis, defect isolation, and physical characterization. JEOL JWS 7555 is the perfect addition to any laboratory or production environment that needs an advanced and reliable SEM. The intuitive user interface and versatile applications make this a perfect tool to quickly and accurately analyze any surface or structure and provides the results exactly as needed. As a result, efficient and accurate analysis can be done quickly and easily.
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