Used JEOL JWS 7555 #9390726 for sale

JEOL JWS 7555 is a scanning electron microscope (SEM) that is used in a wide range of industries and research facilities. This powerful microscope is ideal for imaging and analyzing features at nanometer resolution. With its broad spectrum of imaging capabilities, JWS 7555 can be used to observe small objects or structures such as cells, metals, electronics, and semiconductor materials with unprecedented detail. JEOL JWS 7555 is a multi-mode instrument that offers a variety of imaging modes, allowing for a high degree of versatility and precision when it comes to image capture. This microscope features an in-lens secondary electron detector and a cold field emission gun for more accurate imaging than many other models on the market. It also offers a secondary electron imaging equipment using a back-scattered electron detector to provide greater contrast in images. The microscope has an automated vacuum acquisition system and a built-in gas-cooled chamber which help to maintain better vacuum integrity during imaging and prevents condensation from forming on the specimen. The high-resolution imaging capabilities of JWS 7555 are further enhanced by the integration of several cutting-edge imaging technologies. High-resolution compositional analysis capabilities are provided by a microprobe energy dispersive X-ray analysis unit. This machine is capable of analyzing the elemental composition of the sample at nanometer spatial resolution. An on-board digital image processing tool is used to clean up noise on captured images, providing more accurate imaging and analysis results. JEOL JWS 7555 is a comprehensive, user-friendly asset that is well-suited to a variety of scientific applications. It is also a reliable solution for research and industry applications, providing reliable images and analysis data that can be used for a variety of purposes.