Used JEOL JWS 7555S #293628489 for sale

JEOL JWS 7555S is a versatile, high- performance scanning electron microscope (SEM) designed for a range of analytical applications. This advanced model is designed for optimized imaging, elemental microanalysis and beam lithography capabilities. JEOL JWS-7555S offers robotics-based navigation and navigation-controlled optics, opening up significant improvements in imaging quality and user experience. Available with automated stage and motorized column, JWS 7555 S allows for automated measurements such as focus adjustments and stage movement. The robust performance and advanced capabilities of JWS 7555S gives users the freedom to perform a wide range of tasks with the highest precision, including particles analysis, line scanning, chemical analysis, imaging, structures studies and more. JEOL JWS 7555 S is capable of performing backscattered electron imaging, EDS elemental analysis, as well as other various related analysis. JWS-7555S is capable of high resolution imaging, offering ultra-high resolution imaging at 8 nm level with a special dual side detector viewpoint. Its integrated monochromator also allows for higher resolution imaging in both light and heavy elements. JEOL JWS 7555S also provides a wide field of view (FOV), which allows the user to observe a wider range of details in samples. Additionally, the microscope can also achieve greater depth of field (DOF) for higher-resolution 3D imaging, as well as better contrast for more accurate image analysis. JEOL JWS-7555S comes with advanced software that provides automated analyses, calculating peak profiles in seconds. It also offers a range of automated features, such as automated SEM imaging, data collection and automated analysis. JWS 7555 S also features an innovative, low vacuum chamber (LV), allowing users to observe and analyze samples under a wide range of conditions, from low to high vacuum. JWS 7555S also offers a range of detectors for various applications, such as Secondary Electron (SE), Backscattered Electron (BSE), X-ray, Ultraviolet Photoelectron (UVP), X-ray Spectroscopy, EELS and Electron Backscatter Diffraction systems (EBSD). Overall, JEOL JWS 7555 S is an advanced, high performance scanning electron microscope that provides users with a range of features, powerful capabilities and an exceptional user experience. This SEM is an ideal choice for scientists and engineers that require an advanced instrument that offers high resolution imaging, sophisticated analytical capabilities and a range of automated features.