Used JEOL JWS 7555S #293761147 for sale

JEOL JWS 7555S is a high performance scanning electron microscope (SEM) ideal for sample surveillance, defect inspection, and education in the realms of materials science, life sciences, and semiconductor research. This tool provides high resolution imaging, with a resolution of 0.2 nanometers in secondary electrons, as well as a wide field of view of up to 13mm in diameter. The SEM functions as a powerful in-lens secondary electron detector in addition to its typical scanning and imaging ability. Its main features include a comprehensive sample preparation chamber. JEOL JWS-7555S presents a host of sample preparation methods, such as sputtering with argon, coating with carbon, heat treatments, and the manipulation of vacuum levels. These features make the preparation of a wide range of samples possible. Additionally, its analytical equipment provides considerably more detail than traditional optical microscopes. The analytical system includes energy dispersive spectroscopy, cathodoluminescence, and everlance analysis. JWS 7555 S also has an automated stage unit. This allows for sample non-contact motion within its 3-axis closed-loop motion. The stage is also equipped with an auto-focus feature that can finely adjust focus without any manual intervention. An automated flatness detection machine minimizes optical distortions of the image during imaging. The stability of the tool is exceptional. JEOL JWS 7555 S provides a vibration-free sound specter control to minimize the effects of environment effects on the data. This helps minimize shifts in the position of the electron beam. Additionally, the tool includes collision avoidance features that reduce the possibility of collision between samples and the electron beam. In conclusion, JWS 7555S is a high performance scanning electron microscope that provides outstanding resolution and capabilities. Its extensive sample preparation chambers and automated stage asset provide unprecedented detail and accuracy and make it an ideal choice for high-level research.