Used JEOL JWS 7555S #9139641 for sale

JEOL JWS 7555S is an advanced scanning electron microscope (SEM) that provides high-resolution imaging of specimens with a large numerical aperture. The microscope employs an electron column design with a high-resolution Schottky Field Emission Source (FES) to reduce drift and improve resolution. The multi-channel detector system consists of a Lumatec Aperture, a dual-detector SE/HAD Detection System, a 4channel Super X-RAY EDX for elemental analysis, and an EDS system for energy spectra. The integrated digital imaging and analysis systems provide powerful imaging, controlling, documenting, and analyzing capabilities. The design of JEOL JWS-7555S enables a wide range of imaging and analysis capabilities, such as imaging to depths beyond 1 µm with greater than 30K magnifications; high contrast, low noise imaging; rapid, multiple-frame imaging; automated navigation processes; and simultaneous display of multiple images. The microscope also provides elemental analysis with energy dispersive X-ray (EDX) spectroscopy, allowing users to open menus and analyze samples quickly. The scanning electron microscope features an ergonomic design and highly automated workflows, so it is easy to use for multiple applications. The microscope also offers automated functions such as auto-alignment and auto-recalibration. The integrated software makes it easy to have an optimized user-interface and control, as well as automated search and analysis capabilities. JWS 7555 S enables unparalleled resolution and image acquisition, as well as minimizes the need for an operator to manually adjust the microscope for optimal results. The microscope also provides multiple output formats allowing users to export, print, or share results. Its advanced technological features enable researchers to observe and analyze the finest specimens with great detail.