Used JEOL JWS 8000Z #293621075 for sale

JEOL JWS 8000Z is a high-precision scanning electron microscope (SEM) that is designed for reliable, high-performance imaging and analysis of material surfaces and sub-surface structures. It is a dual-beam SEM/Focused Ion Beam (FIB) instrument, which allows for simultaneous imaging and nanostructure fabrication. The 8000Z has an ultra-high-resolution cold field emission (CFEM) gun, which delivers a high-quality Tungsten beam with a maximum accelerating potential of 1.6 kV and low beam current noise and achieves superior resolution, depth of field, and low-charge operation. The 8000Z is equipped with a high-contrast backscatter detector and a combined in-lens secondary electron detector and traditional backscatter detector to provide accurate compositions and structural information with ultra-high sensitivity. It also has a variable pressure (VP) chamber to analyze insensitive materials that require low acceleration voltage. The 8000Z also has sample automation features, enabling automated sample preparation, imaging, and analysis using a multi-stage motor-controlled stage. The 8000Z also has an onboard Everhart-Thornley Segmented Detector, allowing the user to perform energy-dispersive X-ray (EDX) analysis with superior resolution. The automated WDS Elemental Mapping feature also allows for micro-analytical measurement of the composition of samples. The 8000Z has a user-friendly graphical user interface with a touch-screen monitor and advanced software that allows for powerful and easy operation and GIS-based remote control. All settings are stored in memory to enable repeatable results and analysis with the same conditions. Overall, JEOL JWS-8000Z is an advanced, high-resolution electrostatic scanning electron microscope (SEM) with an ultra-high resolution cold field emission gun, versatile detectors, sample automation features, and an onboard Everhart-Thornley Segmented Detector. It provides superior imaging quality and precision analytical capability, delivering reliable performance for imaging and analysis applications across a variety of industries.