Used JEOL JWS 8000Z #293799852 for sale

JEOL JWS 8000Z is a scanning electron microscope (SEM) designed to study samples with ultra high resolution and contrast. The SEM has a large field of view and high-efficiency cooling due to its advanced design. The scanning electron micrographs produced are of excellent quality. The instrument is equipped with an automated stage which allows for the quick and accurate selection of sample areas for imaging. This facilitates the exploration and analysis of samples with maximum convenience and precision. JEOL JWS-8000Z is equipped with a composite column main chamber, which is capable of controlling the high tension and angle of electron beam emission. It also has an ultra-precise stepper motor used for X-Y scanning and magnification equipment. This combination of advanced technologies ensures the quality images produced have a high resolving power and contrast. In addition, inbuilt beam deceleration technology improves imaging details and contrast while minimizing sample damage. The microscope is also equipped with a highly efficient, low-noise turbo-molecular pumping system. This unit provides ample amounts of vacuum for imaging at low and medium magnifications. JWS 8000Z also features a versatile energy filter machine. This tool enables the user to capture sharp energy dispersivespectra (EDE) and energy filtered images (EFI) data, by filtering off unwanted electrons or atoms. The microscope has an embedded EDS asset - a powerful secondary electron detector that helps detect trace elements with a 20 eV discrimination. Finally, the SEM includes a fully-functioning automated image recording model. This equipment is based on digital imaging and further accelerates the imaging process with high-quality digital images of samples. The sophisticated software enables simultaneous recording of images and X-ray mapping. Overall, JWS-8000Z is a powerful imaging tool for a wide range of materials studies and processes with ultra-high resolution, contrast and sharpness, thus providing superior information for analysis. It is reliable and easy to use, making it an ideal choice for routine and research applications.