Used JEOL JWS 8755S #9035885 for sale

JEOL JWS 8755S scanning electron microscope (SEM) is a popular model of SEM used in many fields of science and technology, including materials science, environmental studies, and medical imaging. JWS 8755S provides powerful analytical capabilities and superior magnification capabilities. The system features an ultra-high resolution of 2.5 nm, a large field of view, and excellent back scattered electron imaging capability. The magnification range is wide, with 5 to 175kX magnification range and 1kX to 1 millionx magnification range. It can also achieve extremely high brightness levels and contrast levels, allowing for detailed imaging of small structural details. JEOL JWS 8755S also offers advanced functions for high speed digital video capability. JWS 8755S features a variable pressure sample chamber, allowing for the analysis of samples in a range of pressure environments. This feature also makes the system great for examining samples in a vacuum, such as in electron microscopes with resistant coatings. Additionally, the configuration of the large tow-stage sample stages enable a broad range of sample analysis using multiple detectors. JEOL JWS 8755S offers advanced optical and digital capabilities, such as a high contrast anti-contrast detector, dual energy filters, and electron beam blanking. It also has advanced software and automated data collection with camera imaging functions, a large internal storage capacity, and a user-friendly computer interface. JWS 8755S has a powerful automated analysis package for automated image analysis of samples, providing superior imaging quality for a wide variety of applications. In addition, this model also offers information source tracking and deceleration voltage direct control. The automated analysis package allows for simple analysis of samples, as well as more complex applications such as automated chemical analysis. Overall, JEOL JWS 8755S offers a variety of advanced capabilities and features, making it an ideal choice for a wide range of scanning electron microscope applications. The versatile design and system software make this model an excellent choice for medical imaging, environmental studies, materials science, or any other SEM application where high resolution imaging and analysis are necessary.