Used JEOL JXA 733 #9033622 for sale

JEOL JXA 733 is a high-precision scanning electron microscope that offers excellent performance for a variety of imaging applications. It is equipped with a multi-mode detector that can be used to capture secondary electon, backscattered electron, and cathodoluminescence images. With fast scanning speeds and a laser autofocus equipment for scanning areas of up to 100mm, JEOL JXA-733 is capable of producing high-resolution images of objects from a variety of materials, including organic and non-organic specimens. The SEM's main components include a filament, an electron column, a vacuum chamber, an electron gun, an objective lens, and an imaging system. The filament is made of tungsten and is mounted in the electron column. The electrons emitted from the filament are accelerated to a high voltage, up to 30 kV, before being directed towards the sample. The objective lens focuses these electrons onto the sample and the imaging unit is used to capture and analyze the image. JXA 733 features variable pressure control technology that provides stability at low magnifications and reduces the effects of drift and vibration. It also includes a wide dynamic range detector and an adjustable threshold setting to optimize image contrast and noise. Other features of JXA-733 include a low background surface contamination machine to protect the sample from cross contamination, a specimen chamber with a maximum magnification of 800x, and a sample surface temperature control tool for analyzing specimens at different temperatures. Additionally, the microscope is equipped with an integrated motorized stage that increases the repeatability of images and data collected. JEOL JXA 733 is an advanced scanning electron microscope that provides excellent performance and is ideal for a variety of imaging applications. Its variable pressure control asset and wide dynamic range detector allow for better image capture and analysis, and its adjustable settings provide optimal image quality and noise reduction. With a wide range of features and high-precision imaging capabilities, JEOL JXA-733 is a reliable tool for scanning electron microscopy.