Used JEOL JXA 8100 #293753152 for sale

JEOL JXA 8100 is a scanning electron microscope that offers a range of analytical capabilities for imaging, chemical analysis, and more. This universal imaging equipment is suitable for a variety of applications, and its key features include a large working distance and a wide range of operation voltages. JXA 8100 is equipped with a large-amplitude Pole-Piezoelectric (PPZ) electromagnet column, which features extremely high lateral, vertical and rotational stability. This ensures that a high level of image resolution is achieved, even when viewing large sample sizes or samples of various shapes and sizes. The PPZ column is also capable of operating at a wide range of voltages, making it suitable for low-vacuum, high-vacuum, and even cryogenic operation. JEOL JXA 8100 is also equipped with a high-power, in-lens secondary electron detector, which is capable of detecting electrons at a wide range of energies. This electron detector is able to detect electrons with energies ranging from 500 eV to over 30,000 eV, allowing for the analysis of samples from a wide range of materials and providing high-contrast images The electron detector also features a variable spot size and a variable scan rate that can be adjusted to obtain images with the desired resolution. JXA 8100 is also equipped with an automated sample stage, which allows samples to be moved rapidly and accurately. The stage can move samples in the x-, y-, and z-axes, as well as rotate them, allowing operators to view samples from any angle and to quickly switch between samples. This sample stage is ideal for performing complex tasks, such as chemical surface analysis, elemental composition analysis, and more. JEOL JXA 8100 has recently been upgraded with a Perspex vacuum system, which provides the high-vacuum environment necessary for imaging and analysis. This unit is equipped with a high-performance vacuum pump that provides vacuum levels as low as 1 x 10-7 mbar and ensures that contaminants are effectively removed from samples before imaging and analysis. JXA 8100 also features an automatic image acquisition machine that allows for rapid image acquisition and saves images for later evaluation. This tool can capture both static and dynamic images, allowing for real-time observation of samples as they are being studied. Finally, JEOL JXA 8100 is equipped with a convenient integrated control panel that allows operators to easily monitor and adjust settings while the microscope is in use. This control panel also allows users to quickly save images and shift between samples easily.