Used JEOL JXA 840 #9173746 for sale

JEOL JXA 840 is a scanning electron microscope (SEM), which is an important tool for visualizing materials at high resolution. The instrument is capable of observing structures and features with a resolution down to a few nanometers. This allows for detailed study of a variety of materials such as metals, ceramics, semiconductors, and biological specimens. JXA 840 utilizes an electron beam in order to scan across a sample, creating a detailed image. The instrument features a fully automated, high-precision x-y scan drive that enables high-speed scanning, which makes it ideal for applications requiring high throughput. The instrument offers variable acceleration voltages ranging from 0.05 to 30kV, allowing for imaging and elemental analysis of a wide range of sample types. In addition to conventional imaging, the instrument also offers a range of specialized imaging capabilities from low-kV imaging to cryo conditions. The instrument includes an integrated optical microscope, allowing for both visual and electronic observation of samples. This capability is particularly useful for examining samples that require a larger magnification range. JEOL JXA 840 includes an option for energy dispersive spectrometry (EDS), which can be used to analyze sample composition. The instrument also features a well-shielded, low-vibration, high-sensitivity EDS detector that is protected from electromagnetic interference, which allows for accurate and reliable elemental analysis results. The instrument has a large sample chamber with a temperature range from 10C to 600C, making it suitable for a wide range of temperature-dependent applications such as thermal analysis. Furthermore, the instrument is equipped with a sample metalizer with a range of deposition metals, which is useful for replicating and preserving the topography of various sample surfaces. Overall, JXA 840 is an incredibly versatile SEM with high precision and resolution that is suitable for a wide range of research applications. With its integrated imaging and analysis capabilities, it is an invaluable tool for characterizing, analyzing, and imaging materials at the nanoscale.