Used JEOL JXA 8600 #293619820 for sale

JEOL JXA 8600 is a field emission scanning electron microscope (FESEM) with excellent imaging and analytical capabilities. It has an ultra-precise, achromatic electrostatic column, which provides high-resolution imaging in all modes, including coma-free electron optics and polarized light operation. This makes it ideal for a range of material analyses. The microscope is outfitted with a large, dual-axis port and sample chamber, allowing for easy operations and support of different sample types. This includes both materials in the platform and additional sample loading options. The lens chamber is equipped with multiple stage plates, allowing for multiple sample analysis. The workstation can include four energy dispersive X-ray analyzers for elemental mapping and analysis. JXA 8600 is capable of creating stunning image detail and resolution. The system is equipped with an ultra-low background electron beam, a high-energy and low-voltage detector, and a new low voltage imaging system. This allows for the capture of high-resolution images of organic material and other non-metal or semi-conductors. Additionally, the variable pressure SEM allows for the observation of sub-micrometer details in air or fluids. The system is also equipped with a range of particle analysis tools, including Semiquantitative and Qualitative Analysis, Particle Size Analysis, Total Reflection X-ray Fluorescence Analysis, X-ray Diffraction, and Electron Backscatter Diffraction. The efficient electron-beam optics and the high efficiency of elemental alloy detection offer a high-speed data acquisition rate (up to 5sec per element). It also has a high-resolution zoom lens, allowing for detailed mapping and pattern analysis of specimen surfaces. Thanks to its compact design and relatively low power consumption, JEOL JXA 8600 can be easily integrated into a wide range of laboratory setups. This makes it an attractive choice for research institutes and universities looking to explore a range of materials and understand the properties of their structure.