Used KLA / TENCOR 8100 #293648703 for sale

KLA / TENCOR 8100
ID: 293648703
Critical Dimension Scanning Electron Microscope (CD-SEM).
KLA / TENCOR 8100 Scanning Electron Microscope (SEM) is a powerful tool for performing a wide range of imaging, analysis, and metrology tasks. This SEM is capable of generating high-resolution images of objects down to 1 nanometer in size. It features an intuitive operator interface, which allows operators to quickly set up and tune their experiments. In addition, KLA 8100 SEM has an advanced imaging system that can achieve magnifications up to 100,000x. This high magnification is essential for observing objects with fine detail. TENCOR 8100 SEM uses an electron beam to view the sample's surface. A high-energy electron beam is focused onto the sample and interacts with the atoms in the sample's surface. When this occurs it produces a contrast effect which creates the image of the sample. The intensity of the electron beam can be controlled and adjusted in order to obtain the best possible image. 8100 SEM also has an automated sample alignment system which ensures that the sample is properly positioned for image capture. In addition to being able to generate high-resolution images, this SEM also has the ability to perform analysis and metrology tasks. KLA / TENCOR 8100 SEM is equipped with an integrated energy dispersive x-ray unit which provides chemical compositional analysis of the sample. KLA 8100 also includes other integrated probes such as an apertures, wafers, and films which are necessary for performing a variety of metrology tasks. TENCOR 8100 Scanning Electron Microscope is a powerful tool that is ideal for the investigation of a wide range of objects. Its intuitive interface, ability to generate high-resolution images, and integrated systems for analysis and metrology tasks make this an invaluable tool for laboratories and research facilities alike.
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