Used KLA / TENCOR 8100 #293652756 for sale

KLA / TENCOR 8100 is a desktop-based scanning electron microscope (SEM), designed specifically for inspecting large-area semiconductor wafers. KLA 8100's advanced electron optics and imaging optics allow it to quickly and accurately capture and analyze images at a high resolution, making it ideal for analyzing device defects and process variations in advanced semiconductor productions. TENCOR 8100 offers an impressive suite of features, such as high-performance energy filter imaging, phase contrast, and spectroscopic imaging. Its energy filter imaging allows for the high contrast imaging of semiconductor devices and enables the elimination of optical interference. The phase contrast imaging capability enhances surface area contrast, allowing for better visualization of small features on complex surfaces. Finally, 8100's spectroscopic imaging enables elemental and chemical mappings of samples for advanced analysis. KLA / TENCOR 8100 offers excellent sensitivity and resolution, allowing for accurate imaging of samples at magnifications up to 6,000x. KLA 8100's high resolution detector is capable of capturing sharp images of objects as small as 1 nanometer in size. Additionally, TENCOR 8100 is equipped with multiple electron and imaging choices, including secondary electrons, backscattered electrons, and bright and dark-field imaging. 8100 is compatible with a wide range of sample holders, including 4-inch and 6-inch wafers, packaged devices, and bumped die. In addition to KLA / TENCOR 8100's advanced imaging capabilities, the system is designed with an intuitive user interface that simplifies operation and reduces training time. A large, full-color LCD display provides interactive control of scanning parameters and allows users to quickly preview and adjust images. KLA 8100 also offers a variety of post processing capabilities that enable efficient review and analysis of images. Overall, TENCOR 8100 is an excellent choice for studying large-area semiconductor wafers. Its powerful imaging capabilities, intuitive user interface, and versatile sample holders make it an ideal tool for detailed defect analysis and process monitoring.